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近三年科研情况 |
1 Yanghong Tan,Yigang He,Yichuang Sun. Data-fused method of fault diagnosis for analog circuits. Analog Integr Circ Sig Process. ,Vol.61:87-92,2009. SCI源刊,SCI、SCIE、EI同时收录
2 Yanghong Tan , Yigang He, Yichuang Sun. Minimizing Ambiguity of Faults and Design of Test Stimuli in Analogue Circuits with Tolerance. International Journal of Electronics, 2010. in publishing. SCI源刊
3 Yanghong Tan, Yigang He,Cun Cui, Guanyuan Qiu. A Novel Method for Analog Fault Diagnosis Based on Neural Networks and Genetic Algorithm. IEEE Transactions on Neural Networks.2008,Vol.57(11): 2631-2639. SCI源刊, SCI、SCIE、EI同时收录
4 Yanghong Tan, He Yigang.A novel method for fault diagnosis of analog circuits based on WP and GPNN. International Journal of Electronics, vol.95(05), 2008.pp. 431 - 439. SCI源刊,SCI、SCIE、EI同时收录
5 Tan, Yanghong. He, Yigang; Fang, Gefeng,Hierarchical Neural Networks Method for Fault Diagnosis of Large-Scale Analog Circuits.Tsinghua Science and Technology, vol.12, SUPPL.1, July, 2007, pp.260-265. EI收录.
6 Tan, Yanghong,He, Yigang;Liu, Meirong.Probabilistic neural network based method for fault diagnosis of analog circuits. Advances in Neural Networks - ISNN 2007 - 4th International Symposium on Neural Networks, pp. 570-579. EI、ISTP收录.
7 Tan Yanghong, He, Yigang. Fused method of fault diagnosis for analog circuits. Proceeding of IEEE CCSA2007,Jinan,China.pp.276-282. SCI收录 |